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N.C. Brown Center for Ultrastructure Studies
The N.C. Brown Center for Ultrastructure Studies, temporarily located in Walters Hall, is a central microscopy facility which provides teaching, research, and public service. It is equipped to provide students, faculty and research staff with access, assistance, and training in modern microscopy techniques. These techniques include light microscopy, scanning electron microscopy, transmission electron microscopy, digital imaging, and image analysis.
This facility was first established in 1957 with the installation of the first transmission electron microscope in central New York. The N.C. Brown Center for Ultrastructure Studies was formally established in 1972 when an ETEC scanning electron microscope was installed in Baker Laboratory. The Center has always maintained a position 
of leadership and excellence in the areas of wood structure and microscopy, both nationally and internationally.
Many departments and programs within the College are represented among the faculty, staff and students who utilize the Center for research. During an average year, 30 faculty, 35 graduate students, and 5 undergraduate students utilize the resources of the Center for their research. Outreach activity is also an important service provided by the Center. These services include providing micrographs for educational purposes, assistance to other universities, tours and demonstrations to interested technology groups, and microscopy assistance to private industry. The projects which are conducted for private industry are generally in the forest products industry or the paper industry. Most of the requests for assistance come from companies located within New York State.
The staff of the Center consists of:
- Dr. Robert Hanna, Director;
- Dr. Susan Anagnost, Assistant Director;
- Dr. Iris Vazquez-Coos, Post-doctoral research associate.
Among the major items of equipment in the Center are a JEOL 2000EX 200 KV transmission electron microscope; a JEOL 5800 low vacuum scanning electron microscope equipped with an EDAX energy dispersive x-ray analyzer; and an array of specialized light microscopes.
Academic Program
The Academic program offered by the Center consists of five graduate-level courses, special topic research projects, and graduate student guidance. Our program is unique in central New York. Even though a number of other institutions are equipped with electron microscopes, we are the only one offering comprehensive formal training in the theory and application of these research tools. The courses offered are as follows:
- ERE 585 – Light Microscopy and Image Analysis– 3 credit hours
- ERE 596 – Microtechnique – 3 credit hours
- ERE 685 – Transmission Electron Microscopy – 5 credit hours
- ERE 785 - Scanning Electron Microscopy – 5 credit hours
- ERE 770 – Biodegradation of Wood
- ERE 796 – Special Topics - Advanced Electron Microscopy 1-3 credit hours
- ERE 796 – Special Topics – Wood Anatomy Research
- WPE 376 – Wood Products Decay
Due to the special nature of these courses, the optimal enrollment is 8-10 students. The conversion to digital imaging has greatly reduced the time commitment for these courses and as a result we are beginning to see an increase in interest from undergraduate students in our academic program.
Scanning Electron Microscope
Our current scanning electron microscope is a JEOL JSM-5800 LV low vacuum scanning electron microscope equipped with an EDAX energy dispersive x-ray spectrometer. The JSM 5800 LV has a resolution of 3.5 nm, a large chamber for microtesting, and a 
eucentric motor-driven stage for unattended analysis. The instrument will operate in both the conventional high vacuum mode or the low vacuum mode of operation.
Low vacuum operation is a recent development in scanning electron microscopy that permits observation of the specimens at pressures as high as 2 Torr and in a hydrated state. The specimen chamber will accommodate an 8 inch diameter specimen with an area of observation 125mmx100mm. The chamber is large enough to install a microtesting device and still have adequate travel to view the specimens.
The JSM 5800 LV is equipped with an EDAX x-ray microanalysis system. The energy dispersive spectrometer (EDS) is an essential and integral component of any multidisciplinary scanning electron microscopy facility. EDS x-ray analysis is employed for the identification, localization and quantification of the chemical components within the specimen.
Transmission Electron Microscope
Our transmission electron microscope is a JEOL JSM-2000EX. The JSM 2000EX has an accelerating voltage of 200 KV. This instrument has a lattice image resolution of 0.14nm and a point image resolution of 0.28 nm and can be operated at a magnification of 1,000,000 X. The accelerating voltage of 200KV also permits the observation of thick specimens. It has a side entry goniometer and can perform micro electron diffraction. Other capabilities are a specimen position memory function, an auto through focus function, and optimum underfocus function, a minimum dose system, and an image data recording function
Light Microscopes and Image Analysis
The Center is outfitted with an array of Nikon light microscopes that are equipped for various LM techniques. These techniques include brightfield (transmitted and reflected), phase contrast, darkfield, UV fluorescence, video enhanced contrast, polarization, oil immersion, and Nomarski differential interference contrast. Images can be recorded either on film or with a Spot RT digital camera (1600x1200 pixels).
Image Pro Plus and Metamorph are the two image analysis systems that are currently used in the Center.
