Micromechanical Repair and Experimental Apparatus Fabrication
- Reserve time on the Microscopes with FACES
Contact David Kiemle email@example.com, 470-6883 to obtain log-on infomation for the FACES scheduling system.
NSF Funds $1.12M for Transmission Electron Microscope at ESF
$1.12 million NSF Grant awarded to ESF for a cryo field emission scanning transmission electron microscope. The successful proposal was submitted by Dr. Susan E. Anagnost, Robert P. Smith, M.S, Dr. Ivan Gitsov from ESF; Dr. Mathew M. Maye from Syracuse University; and Dr. Stephan Wilkens from Upstate Medical University. Read more >>
Scanning Electron Microscope
The newly acquired JEOL JSM-IT100LA Scanning Electron Microscope has the following characteristics: 4nm resolution; magnification, 8x-300,000x; voltage, <1kV to 20kV; Computer controlled beam alignment, saturation and centering, brightness and contrast, automatic focusing and active tone; detectors include: Secondary, Backscatter, Low Vacuum Secondary, X-Ray; Low Vacuum uncoated imaging with Secondary and Backscatter; capable of mixing signals from 10-90%; STEM function allows imaging of thin samples on grids up to 40,000x; Insulated Cryo-Stub for low vacuum in-situ freeze-drying of biological samples; Motorized eucentric stage in X-Y, manual in Z, T and R; 23 inch monitor with option of touch screen controls, wall monitor for larger audiences; Stage Navigation System, Image processing functions: zoom, averaging, split display; metrology function: multipoint, circle, line width, angle measurement and particle counting functions; Data display appears on image in high vacuum and low vacuum modes; File saving of all functions with image in BMP, TIFF or JPEG; Standard or Custom Recipes for image observation conditions. EDS x-ray spectra includes point and area analysis, mapping, semi-quantitative, reports generated in MS Word or PowerPoint. Microsoft Word and Excel installed; Ancillary equipment includes: Tousimis critical point dryer, Gold, Palladium or Platinum targets on an Edwards Sputter and Carbon Coater, Ladd High Vacuum Evaporator.
Transmission Electron Microscope
Our transmission electron microscope is a JEOL JSM-2000EX. The JSM 2000EX has an accelerating voltage of 80-200 kV. This instrument has a lattice image resolution of 0.14nm and a point image resolution of 0.28 nm and can be operated at a magnification of 1,000,000 X. The variable accelerating voltage permits the observation of negative stained proteins, bacteria, viruses or ultrathin sections at the lower kV as well as superior resolution of nanoparticles and thick specimens at higher voltages. It has a side entry tilt stage goniometer that can perform 3D reconstruction of macromolecules, single particles and tomography of whole cells. It can also perform micro electron diffraction yielding atomic resolution on thin samples as has been accomplished with purple membrane. Other capabilities are a specimen position memory function, an auto through focus function, an optimum underfocus function, a minimum dose system, and an image data recording function. The lab has ancillary equipment that allows for ultrathin (60nm) sectioning using diamond knives of resin or frozen material, freeze-substitution, rotary shadowing, immunolabeling, freeze fracturing of various samples both biological and materials.
Light Microscopes and Image Analysis
The Center is outfitted with an array of Zeiss and Nikon light microscopes that are equipped for various LM techniques. These techniques include brightfield (transmitted and reflected), phase contrast, darkfield, UV fluorescence using multiple filters, video enhanced contrast, polarization, oil immersion, and Nomarski differential interference contrast. Images are recorded using a Spot RT or K digital cameras (1600x1200 pixels) and recorded into Spot, Image Pro Plus 7.0, Image J or Photoshop. The lab is set up for correlative microscopy where the same sample is viewed by light, scanning and transmission electron microscopy. The lab has several sliding microtomes for preparing thin sections of wood or hardened materials for light microscopy.